Principal angle, principal azimuth, and principal-angle ellipsometry of film-substrate systems

Contours of constant principal angle and constant principal azimuth in the complex Îμ plane

Combined reflection and transmission thin-film ellipsometry: a unified linear analysis.

A scheme of combined reflection and transmission ellipsometry on light-transmitting ambient-film-substrate systems is proposed and the required sample design and instrument operation are investigated. A comparative study of the sensitivity of external and internal reflection and transmission ellipsometry is carried out based on unified linear approximations of the exact equations. These approxi...

Principal angles and principal azimuths of frustrated total internal reflection and optical tunneling by an embedded low-index thin film.

The condition for obtaining a differential (or ellipsometric) quarter-wave retardation when p- and s-polarized light of wavelength λ experience frustrated total internal reflection (FTIR) and optical tunneling at angles of incidence ϕ ≥ the critical angle by a transparent thin film (medium 1) of low refractive index n1 and uniform thickness d, which is embedded in a transparent bulk medium 0 of...

Plurality of principal angles for a given pseudo-Brewster angle when polarized light is reflected at a dielectric-conductor interface.

The pseudo-Brewster angle phi(pB) of minimum reflectance for p-polarized light and the principal angle phi at which incident linearly polarized light of the proper azimuth is reflected circularly polarized are considered as functions of the complex relative dielectric function epsilon of a dielectric-conductor interface over the entire complex epsilon plane. In particular, the spread of phi for...

Fringe and Noise Reductions of pMAIRS Spectra Using Principal Component Analysis.

Infrared p-polarized multiple-angle incidence resolution spectrometry (pMAIRS) is a promising analytical tool for revealing the molecular orientation quantitatively of each chemical group in a thin film even with surface roughness. The spectra are often disturbed by noise and fringe, however, due to the multiple reflections in the substrate and the film, which makes the quantitative analysis ve...